FBI Counterintelligence Division Secures Conviction of Engineer Who Stole Philips X-Ray Trade Secrets for Chinese Competitor
A federal jury in Chicago convicted former Philips Medical Systems engineer Chih-Yee Jen, 71, of Mequon, Wisconsin, on Friday of conspiracy to steal trade secrets and possession of stolen trade secrets, according to the Justice Department
Jen's conviction closes the domestic prosecution but leaves the transfer's principal beneficiaries untouched: Du and the two Kunshan GuoLi entities sit on the Fugitive Calendar in China, unarraigned and outside US enforcement reach. The verdict demonstrates FBI Counterintelligence's capacity to build cases from internal database exfiltration and insider recruitment at closing US manufacturing sites, a pattern that recurs as plants shutter and departing engineers carry proprietary designs to foreign buyers. Sentencing for Jen, Tendian, and Nevtonenko will fix the deterrent value of the case. The stolen X-ray tube designs have by now been integrated into Kunshan GuoLi's competing product line.
3 sources
- Federal Jury in Chicago Convicts Engineer for Stealing Trade Secrets from Philips Medical Systems on Behalf of Chinese Competitor -
Department of Justice - Former Philips engineer convicted of stealing trade secrets for China firm -
The Washington Times - US convicts ex-Philips engineer for exposing X-ray secrets to competitor -
The Register